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Year: 2009 Publisher: Aberdeen Proving Ground, MD : Army Research Laboratory,
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Polyethylene. --- X-ray photoelectron spectroscopy. --- Ultraviolet radiation. --- Oxidation. --- Surface energy.
Book
Year: 2009 Publisher: Aberdeen Proving Ground, MD : Army Research Laboratory,
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Polyethylene. --- X-ray photoelectron spectroscopy. --- Ultraviolet radiation. --- Oxidation. --- Surface energy.
Book
ISBN: 1617282405 9781617282409 9781616689155 1616689153 Year: 2011 Publisher: New York : Nova Science Publishers,
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X-ray photoelectron spectroscopy (XPS) is a quantitative spectroscopic technique that measures the elemental composition, empirical formula, chemical state and electronic state of the elements that exist within a material. XPS spectra are obtained by irradiating a material with a beam of X-rays while simultaneously measuring the kinetic energy (KE) and number of electrons that escape from the top 1 to 10 nm of the material being analyzed. This book reviews research in the field of X-ray photoelectron spectroscopy including: XPS studies from industrial and bioactive glass to biomaterials and
Book
ISBN: 3540105840 0387105840 3540385800 Year: 1981 Publisher: Berlin Springer
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Year: 2008 Publisher: Aberdeen Proving Ground, MD : Army Research Laboratory,
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Ceramic materials --- X-ray photoelectron spectroscopy. --- Composite materials --- Brittleness --- Testing. --- Bonding --- Testing.
Book
Year: 2008 Publisher: Aberdeen Proving Ground, MD : Army Research Laboratory,
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Ceramic materials --- X-ray photoelectron spectroscopy. --- Composite materials --- Brittleness --- Testing. --- Bonding --- Testing.
Book
ISBN: 9780854045525 9781847558640 085404552X 184755864X Year: 2008 Publisher: Cambridge, UK : RSC Pub.,
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Portable X-ray fluorescence (PXRF) instrumentation has some unique analytical capabilities for the in situ analysis of samples in the field. These capabilities have been extended in recent years by the continuing development of solid state detectors, surface mounted electronics, digital signal processing technology, Li-ion batteries combined with a choice of rugged sealed radioisotope sources or miniature X-ray tubes that provide lightweight hand-held devices. As well as opening up new applications, in situ measurements by PXRF, where the instrument is placed in direct contact with the object
X-ray spectroscopy. --- Spectroscopie des rayons X. --- X-ray spectroscopy --- Emission spectroscopy, X-ray --- Energy dispersive x-ray spectroscopy --- Excitation analysis, Fluorescent --- Fluorescence analysis, X-ray --- Fluorescent excitation analysis --- Fluorescent x-ray spectroscopy --- X-ray emission spectroscopy --- X-ray fluorescence analysis --- Spectrum analysis --- XES (X-ray emission spectroscopy) --- X-ray photoelectron spectroscopy. --- Electron spectroscopy for chemical analysis --- ESCA (Electron spectroscopy for chemical analysis) --- XPS (X-ray photoelectron spectroscopy) --- Photoelectron spectroscopy
ISBN: 0471920827 0471920819 9780471920816 9780471920823 Year: 1992 Publisher: Chichester Wiley
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Experimental solid state physics --- Spectrometric and optical chemical analysis --- fysicochemie --- Surfaces (Technology) --- Electron spectroscopy. --- Analysis. --- 543.08 --- 543.42 --- Analytical measurement --- Spectrum analysis. Spectroscopy. Spectrography. Spectrometry. Spectrophotometry. Fluorescence analysis --- 543.42 Spectrum analysis. Spectroscopy. Spectrography. Spectrometry. Spectrophotometry. Fluorescence analysis --- 543.08 Analytical measurement --- -Electron spectroscopy for chemical analysis --- Applied chemical analysis --- Materials sciences --- Electron spectroscopy --- ESCA --- Electrons --- X-rays --- Characterization of surface --- Surface analysis --- Surface characterization --- Chemistry, Analytic --- Surface chemistry --- Analysis --- Emission --- Surfaces (technologie) --- Spectroscopie électronique. --- Analyse --- Analyse. --- SURFACES --- Auger photoelectron spectroscopy --- X-RAY PHOTOELECTRON SPECTROSCOPY --- Monograph --- Surfaces. --- X-ray photoelectron spectroscopy. --- Electron spectroscopy for chemical analysis --- ESCA (Electron spectroscopy for chemical analysis) --- XPS (X-ray photoelectron spectroscopy) --- Photoelectron spectroscopy --- Curved surfaces --- Geometry --- Shapes --- Analytical chemistry --- -Characterization of surface --- Surfaces (Technology) - Analysis. --- -Analysis
Multi
ISBN: 9783642273810 9783642273803 Year: 2013 Publisher: Berlin ; Heidelberg : Springer,
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To anyone who is interested in surface chemical analysis of materials on the nanometer scale, this book is prepared to give appropriate information. Based on typical application examples in materials science, a concise approach to all aspects of quantitative analysis of surfaces and thin films with AES and XPS is provided. Starting from basic principles which are step by step developed into practically useful equations, extensive guidance is given to graduate students as well as to experienced researchers. Key chapters are those on quantitative surface analysis and on quantitative depth profiling, including recent developments in topics such as surface excitation parameter and backscattering correction factor. Basic relations are derived for emission and excitation angle dependencies in the analysis of bulk material and of fractional nano-layer structures, and for both smooth and rough surfaces. It is shown how to optimize the analytical strategy, signal-to-noise ratio, certainty and detection limit. Worked examples for quantification of alloys and of layer structures in practical cases (e.g. contamination, evaporation, segregation and oxidation) are used to critically review different approaches to quantification with respect to average matrix correction factors and matrix relative sensitivity factors. State-of-the-art issues in quantitative, destructive and non-destructive depth profiling are discussed with emphasis on sputter depth profiling and on angle resolved XPS and AES. Taking into account preferential sputtering and electron backscattering corrections, an introduction to the mixing-roughness-information depth (MRI) model and its extensions is presented.
Physics --- Optics. Quantum optics --- Solid state physics --- Surface chemistry --- Theoretical spectroscopy. Spectroscopic techniques --- MRI (magnetic resonance imaging) --- legeringen --- vaste stof --- materie (fysica) --- oppervlakte-onderzoek --- spectroscopie --- microscopie --- fysica --- X-ray photoelectron spectroscopy --- Auger effect. --- Spectroscopie photoélectronique des rayons X --- Effet Auger --- EPUB-LIV-FT LIVCHIMI SPRINGER-B
Book
ISBN: 3319240412 3319240439 Year: 2016 Publisher: Cham : Springer International Publishing : Imprint: Springer,
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This book provides the first complete and up-to-date summary of the state of the art in HAXPES and motivates readers to harness its powerful capabilities in their own research. The chapters are written by experts. They include historical work, modern instrumentation, theory and applications. This book spans from physics to chemistry and materials science and engineering. In consideration of the rapid development of the technique, several chapters include highlights illustrating future opportunities as well.
Physical & Theoretical Chemistry --- Atomic Physics --- Chemistry --- Physics --- Physical Sciences & Mathematics --- X-ray photoelectron spectroscopy. --- Electron spectroscopy for chemical analysis --- ESCA (Electron spectroscopy for chemical analysis) --- XPS (X-ray photoelectron spectroscopy) --- Photoelectron spectroscopy --- Spectroscopy. --- Surfaces (Physics). --- Atomic/Molecular Structure and Spectra. --- Spectroscopy/Spectrometry. --- Spectroscopy and Microscopy. --- Surfaces and Interfaces, Thin Films. --- Surface and Interface Science, Thin Films. --- Surface chemistry --- Surfaces (Technology) --- Analysis, Spectrum --- Spectra --- Spectrochemical analysis --- Spectrochemistry --- Spectroscopy --- Chemistry, Analytic --- Interferometry --- Optics --- Radiation --- Wave-motion, Theory of --- Absorption spectra --- Light --- Spectroscope --- Qualitative --- Atomic structure . --- Molecular structure . --- Microscopy. --- Materials—Surfaces. --- Thin films. --- Interfaces (Physical sciences). --- Surfaces (Physics) --- Films, Thin --- Solid film --- Solid state electronics --- Solids --- Coatings --- Thick films --- Analysis, Microscopic --- Light microscopy --- Micrographic analysis --- Microscope and microscopy --- Microscopic analysis --- Optical microscopy --- Spectrometry --- Structure, Molecular --- Chemical structure --- Structural bioinformatics --- Structure, Atomic --- Atomic theory --- Analytical chemistry
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